Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. ...
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian LandraultSimpo PDF Merge and Split Models in Hardware TestingPDF Merge and Split Unregistered Version - http://www.simpopdf.com FRONTIERS IN ELECTRONIC TESTING Consulting Editor Vishwani D. AgrawalPDF Merge and Split Unregistered Version - http://www.simpopdf.com Volume 43 For further volumes http://www.springer.com/series/5994 Hans-Joachim Wunderlich EditorPDF Merge and Split Unregistered Version - http://www.simpopdf.com Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault 123 Prof. Dr. Hans-Joachim Wunderlich Universität Stuttgart Institut für Technische Informatik Pfaffenwaldring 47 70569 Stuttgart Germany wu@informatik.uni-stuttgart.dePDF Merge and Split Unregistered Version - http://www.simpopdf.com ISSN 0929-1296 ISBN 978-90-481-3281-2 e-ISBN 978-90-481-3282-9 DOI 10.1007/978-90-481-3282-9 Springer Dordrecht Heidelberg London New York Library of Congress Control Number: 2009939835 c Springer Science+Business Media B.V. 2010 No part of this work may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, microfilming, recording or otherwise, without written permission from the Publisher, with the exception of any material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Cover design: eStudio Calamar S.L. Printed on acid-free paper Springer is part of Springer Science+Business Media (www.springer.com) ContentsPDF Merge and Split Unregistered Version - http://www.simpopdf.com 1 Open Defects in Nanometer Technologies . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . 1 Joan Figueras, Rosa Rodr´guez-Monta˜ es, and Daniel Arum´ ı n´ ı 2 Models for Bridging Defects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . 33 Michel Renovell, Florence Azais, Joan Figueras, Rosa Rodr´guez-Monta˜ es, and Daniel Arum´ ı n´ ı 3 Models for Delay Faults . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . 71 Sudhakar M. Reddy 4 Fault Modeling for Simulation and ATPG . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . .105 Bernd Becker and Ilia Polian 5 Generalized Fault Modeling for Logic Diagnosis . . . . . . . . . . . . . . . .. . . . . . . . . . .133 Hans-Joachim Wunderlich and Stefan Holst 6 Models in Memory Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . .157 Stefano Di Carlo and Paolo Prinetto 7 Models for Power-Aware Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . .187 Patrick Girard and Hans-Joachim Wunderlich 8 Physical Fault Models and Fault Tolerance .. . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . .217 Jean Arlat and Yves Crouzet Index . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . .257 v ContributorsPDF Merge and Split Unregistered Version - http://www.simpopdf.com Jean Arlat LAAS-CNRS; Universit´ de Toulouse; 7, avenue du Colonel Roche, e F-31077 Toulouse, France Daniel Arum´ Universitat Polit` cnica de Catalunya (UPC), Electronic Engineering ı e Dpt. ETSEIB, Diagonal 647, 08028 Barcelona, Spain Florence Azais LIRMM-CNRS, 161 rue ada, 34392 Montpellier, France Bernd Becker Albert-Ludwigs-University of Freiburg, Germany Stefano Di Carlo Politecnico di Torino, Control and Computer Engineering Department, Corso duca degli Abruzzi 24, 10129, Torino, ...